About: http://webisa.webdatacommons.org/229911263

Property	Value
http://www.w3.org/1999/02/22-rdf-syntax-ns#type	http://www.w3.org/ns/prov#Entity
http://www.w3.org/ns/prov#value	What is desired, therefore, is a method and apparatus for reducing the time required to test individual dies of a wafer at temperatures above or below the ambient temperature.
http://www.w3.org/ns/prov#wasQuotedFrom	google.com.au