| http://www.w3.org/ns/prov#value | - BRIEF DESCRIPTION OF THE DRAWINGS [0024]FIG. 1 is a schematic cross sectional view of a probe card constructed in accordance with the invention, mounted to a probe card fixture and illustrated during testing of a semiconductor wafer; [0025]FIG. 2 is a bottom view, with the wafer partially cut away, of the probe card shown in FIG. 1; [0026]FIG. 3 is an enlarged portion of FIG. 2 illustrating an int
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