About: http://webisa.webdatacommons.org/288612591

Property	Value
http://www.w3.org/1999/02/22-rdf-syntax-ns#type	http://www.w3.org/ns/prov#Entity
http://www.w3.org/ns/prov#value	Since electromigration in semiconductor devices is generally associated with the use of nearly pure aluminum for interconnect lines, the problem is most easily eliminated by alloying other metals, such as copper, with aluminum.
http://www.w3.org/ns/prov#wasQuotedFrom	google.com