PropertyValue
http://www.w3.org/1999/02/22-rdf-syntax-ns#type
http://www.w3.org/ns/prov#value
  • In addition to support for pattern dependent etch modeling, SEMulator3D 2014 offers higher performance to increase the speed of modeling and analysis of all types of structures and devices, In addition, a range of new user productivity features to enhance efficiency and usability of the platform have been added.
http://www.w3.org/ns/prov#wasQuotedFrom
  • coventor.com