About: http://webisa.webdatacommons.org/444163993

Property	Value
http://www.w3.org/1999/02/22-rdf-syntax-ns#type	http://www.w3.org/ns/prov#Entity
http://www.w3.org/ns/prov#value	When testing the semiconductor device under test, the data is extracted from the memories, and thus the test pattern is produced.
http://www.w3.org/ns/prov#wasQuotedFrom	google.com