About: http://webisa.webdatacommons.org/8026752

Property	Value
http://www.w3.org/1999/02/22-rdf-syntax-ns#type	http://www.w3.org/ns/prov#Entity
http://www.w3.org/ns/prov#value	The invention relates to a test circuit for large scale integrated circuits on a wafer, and more particularly to a test circuit for large scale integrated circuits on a wafer for an improvement in a testability thereof.
http://www.w3.org/ns/prov#wasQuotedFrom	google.com