PropertyValue
http://www.w3.org/1999/02/22-rdf-syntax-ns#type
http://www.w3.org/ns/prov#value
  • The CMP process is comprised of mechanical polishing with a slurry that typically contains an oxide abrasive harder than the materials being removed, such as alumina, ceria, etc., with chemical additives present to promote selective removal of the dielectric insulating layer, TE, FE, BE and barrier, relative to the capacitor recess dielectric.
http://www.w3.org/ns/prov#wasQuotedFrom
  • google.com