{ "items" : [
    { "id" : "http://webisa.webdatacommons.org/399073063"
      "properties" : {
        "http://www.w3.org/1999/02/22-rdf-syntax-ns#type" : [ "http://www.w3.org/ns/prov#Entity" ] ,
        "http://www.w3.org/ns/prov#value" : [ "A method for measuring, comprising the steps of: providing a measuring system, the measuring system including a measuring instrument and a processing device, the measuring instrument including a digital micrometer and a holding member, theholding member having a reference-standard surface formed thereon, the reference-standard surface being at a same horizontal level with an upper surface of a sta" ] ,
        "http://www.w3.org/ns/prov#wasQuotedFrom" : [ "patentgenius.com" ] } },

    { "id" : "http://webisa.webdatacommons.org/prov/254854671"
      "properties" : {
        "http://www.w3.org/ns/prov#wasDerivedFrom" : [ "http://webisa.webdatacommons.org/399073063" ] } },

    { "id" : "http://webisa.webdatacommons.org/prov/253973780"
      "properties" : {
        "http://www.w3.org/ns/prov#wasDerivedFrom" : [ "http://webisa.webdatacommons.org/399073063"] } } }
