<http://webisa.webdatacommons.org/203929452>	<http://www.w3.org/1999/02/22-rdf-syntax-ns#type>	<http://www.w3.org/ns/prov#Entity> .
<http://webisa.webdatacommons.org/203929452>	<http://www.w3.org/ns/prov#value>	"This invention relates generally to the field of measurement of dielectric constant for materials and more particularly to the measurement of dielectric constant for materials used in the manufacture of semiconductor chips and the like." .
<http://webisa.webdatacommons.org/203929452>	<http://www.w3.org/ns/prov#wasQuotedFrom>	<google.com> .
<http://webisa.webdatacommons.org/prov/461862148>	<http://www.w3.org/ns/prov#wasDerivedFrom>	<http://webisa.webdatacommons.org/203929452> .