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An Entity of Type : prov:Entity, within Data Space : webisa.webdatacommons.org associated with source dataset(s)

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  • y-patterned samples in integrated circuitsUS789407011 Aug 201022 Feb 2011Brown UniversityOptical method and system for the characterization of laterally-patterned samples in integrated circuitsUS82646938 Dec 200811 Sep 2012The Regents Of The University Of MichiganMethod and system for measuring at least one property including a magnetic property of a material using pulsed laser sourcesUS8825434 *2
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