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An Entity of Type : prov:Entity, within Data Space : webisa.webdatacommons.org associated with source dataset(s)

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  • The semiconductor integrated circuit device as claimed in claim 3, wherein a wiring group through which the burn-in test patterns are transferred from the pattern generator to the input terminals of the DRAM is commonly used during a normal operation other than a burn-in test operation in which data items are transferred to the CPU to the input terminals of the DRAM.
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