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  • The semiconductor test system is capable of generating test patterns based on predetermined algorithmic sequences and/or inverting data pattern in the test pattern based on predetermined...http://www.google.fr/patents/US20020049943?utm_source=gb-gplus-shareBrevet US20020049943 - Semiconductor test system Recherche avanc???e dans les brevets Num???ro de publicationUS20020049943 A1Type de publicatio
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