PropertyValue
http://www.w3.org/1999/02/22-rdf-syntax-ns#type
http://www.w3.org/ns/prov#value
  • As such, the defect knowledge database process 216 becomes a repository of wafer defect data, images, or other information from a potential vast array of different defect source identifier clients 104.
http://www.w3.org/ns/prov#wasQuotedFrom
  • google.com