About: http://webisa.webdatacommons.org/117592171

Property	Value
http://www.w3.org/1999/02/22-rdf-syntax-ns#type	http://www.w3.org/ns/prov#Entity
http://www.w3.org/ns/prov#value	This result was shown to be largely independent of the perfect wafer probe yield YK. The common use of memory die in MCM and other applications makes reliability prediction for such die of great economic importance to industry.
http://www.w3.org/ns/prov#wasQuotedFrom	google.com