About: http://webisa.webdatacommons.org/12376529

Property	Value
http://www.w3.org/1999/02/22-rdf-syntax-ns#type	http://www.w3.org/ns/prov#Entity
http://www.w3.org/ns/prov#value	One of the primary purposes of wafer probe is to run diagnostic tests to identify die which are not functioning properly, so that only functional die undergo remaining manufacturing operations, such as packaging.
http://www.w3.org/ns/prov#wasQuotedFrom	google.com