About: http://webisa.webdatacommons.org/128443637

Property	Value
http://www.w3.org/1999/02/22-rdf-syntax-ns#type	http://www.w3.org/ns/prov#Entity
http://www.w3.org/ns/prov#value	A method for testing a plurality of integrated circuits, the method comprising arranging the plurality of integrated circuits on a wafer, the plurality of the integrated circuits including a first integrated circuit arranged on the wafer
http://www.w3.org/ns/prov#wasQuotedFrom	patents.com