PropertyValue
http://www.w3.org/1999/02/22-rdf-syntax-ns#type
http://www.w3.org/ns/prov#value
  • The above description and correlating figures, i.e. FIGS. 2(a)-(e), show the process that is employed in the present invention in forming a high aspect hole having vertical sidewalls in a surface of a semiconductor structure.
http://www.w3.org/ns/prov#wasQuotedFrom
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