About: http://webisa.webdatacommons.org/133489355

Property	Value
http://www.w3.org/1999/02/22-rdf-syntax-ns#type	http://www.w3.org/ns/prov#Entity
http://www.w3.org/ns/prov#value	Electromigration is a reliability concern of microelectronic interconnections, especially for flip chip solder bump with high current density applied.
http://www.w3.org/ns/prov#wasQuotedFrom	ieee.org