PropertyValue
http://www.w3.org/1999/02/22-rdf-syntax-ns#type
http://www.w3.org/ns/prov#value
  • The etch mask may comprise of a material commonly used for masking an etch process, such as photoresist, silicon oxide, silicon nitride, etc.
http://www.w3.org/ns/prov#wasQuotedFrom
  • google.es