PropertyValue
http://www.w3.org/1999/02/22-rdf-syntax-ns#type
http://www.w3.org/ns/prov#value
  • This invention relates to the control of physical vapor etching and depositing processes, and particularly of sputter etching or depositing of a material in the manufacture of semiconductor substrates by a sputtering cathode
http://www.w3.org/ns/prov#wasQuotedFrom
  • google.com