About: http://webisa.webdatacommons.org/135922133

Property	Value
http://www.w3.org/1999/02/22-rdf-syntax-ns#type	http://www.w3.org/ns/prov#Entity
http://www.w3.org/ns/prov#value	Generally, periods in which failures occur in a device such as a semiconductor memory device are roughly divided into three periods over time: an initial failure period, a chance failure period, and a wear-out failure period.
http://www.w3.org/ns/prov#wasQuotedFrom	google.com