About: http://webisa.webdatacommons.org/13666438

Property	Value
http://www.w3.org/1999/02/22-rdf-syntax-ns#type	http://www.w3.org/ns/prov#Entity
http://www.w3.org/ns/prov#value	The present invention is a method and apparatus for capacitively testing a semiconductor die or wafer having first and second die terminals.
http://www.w3.org/ns/prov#wasQuotedFrom	google.com.au