PropertyValue
http://www.w3.org/1999/02/22-rdf-syntax-ns#type
http://www.w3.org/ns/prov#value
  • The wafer is also affected adversely by many factors such as distortion caused in the course of its manufacture, distortion caused by chucking when mounting it to the light-exposure apparatus, and distortion caused during such processes as etching and ion implantation.
http://www.w3.org/ns/prov#wasQuotedFrom
  • google.com