| http://www.w3.org/ns/prov#value | - Other objects, features, and advantages of the invention will be apparent from the following description, including the appended claims, taken together with the attached drawings, in which: FIG. 1 is a diagram of a prior art measuring circuit; FIG. 2 is an equivalent circuit of a body of semiconductor material and the contact resistances of the probe at the probe junction points; FIG. 3 is a diagr
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