PropertyValue
http://www.w3.org/1999/02/22-rdf-syntax-ns#type
http://www.w3.org/ns/prov#value
  • The present invention is a method of processing a substrates which is adapted to form a new resist pattern by dissolving a photoresist of a used resist pattern which has been used as an etching mask for forming a backing layer having edge
http://www.w3.org/ns/prov#wasQuotedFrom
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