About: http://webisa.webdatacommons.org/190044515

Property	Value
http://www.w3.org/1999/02/22-rdf-syntax-ns#type	http://www.w3.org/ns/prov#Entity
http://www.w3.org/ns/prov#value	Measuring reflectance at three wavelengths monitors all essential properties of the growing layers, such as growth rate, film thickness, stoichiometry changes and morphology.
http://www.w3.org/ns/prov#wasQuotedFrom	nanotechproject.org