About: http://webisa.webdatacommons.org/191821585

Property	Value
http://www.w3.org/1999/02/22-rdf-syntax-ns#type	http://www.w3.org/ns/prov#Entity
http://www.w3.org/ns/prov#value	r aspect of the present invention is a method for testing a semiconductor memory device having a first access mode, a second access mode, and a test mode.
http://www.w3.org/ns/prov#wasQuotedFrom	patentgenius.com