PropertyValue
http://www.w3.org/1999/02/22-rdf-syntax-ns#type
http://www.w3.org/ns/prov#value
  • Thus, it has been determined that linewidth control problems can arise due to light scattering and reflection from the substrate-underlay interface during exposure of the photoresist imaging layer to radiation such as ultraviolet light.
http://www.w3.org/ns/prov#wasQuotedFrom
  • google.com