| http://www.w3.org/ns/prov#value | - pattern, and etching the inorganic film and the organic polymer film using the resist pattern as a mask, wherein the improvement comprises using one substance selected from the group consisting of a polyphenylene sulfide, a derivative thereof and a polymer represented by the formula (I): ##STR2## where n is a positive integer, for forming at least one of the organic polymer film and the electron
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