About: http://webisa.webdatacommons.org/214475434

Property	Value
http://www.w3.org/1999/02/22-rdf-syntax-ns#type	http://www.w3.org/ns/prov#Entity
http://www.w3.org/ns/prov#value	The present invention relates in general to functional testing of circuit boards, subsystems, and the like and more particularly to a method and system for adaptive sampling testing of assemblies.
http://www.w3.org/ns/prov#wasQuotedFrom	google.es