PropertyValue
http://www.w3.org/1999/02/22-rdf-syntax-ns#type
http://www.w3.org/ns/prov#value
  • Therefore, there is a problem that a potential dip or pocket tends to occur in the channel layer under the insulating gap to thereby degrade the charge transfer efficiency, especially at drive by the clocks of voltage of 3 V or less.
http://www.w3.org/ns/prov#wasQuotedFrom
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