| http://www.w3.org/ns/prov#value | - The Elemental Analysis Facility houses two portable X-ray Fluorescence devices, a Bruker Tracer IV, and an Innov-X Alpha series portable XRF. With both instruments, it is possible to conduct surface analysis at the ppm level totally non-destructively on a wide range of materials including metals, ceramics, obsidian, and glass.
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