PropertyValue
http://www.w3.org/1999/02/22-rdf-syntax-ns#type
http://www.w3.org/ns/prov#value
  • It is another object of the present invention to provide a method or apparatus for manufacture of microdevices such as semiconductor devices, using such an inspection method.
http://www.w3.org/ns/prov#wasQuotedFrom
  • google.com