PropertyValue
http://www.w3.org/1999/02/22-rdf-syntax-ns#type
http://www.w3.org/ns/prov#value
  • An insulating film including silicon is formed as the first gate insulating film 511b to have a thickness of 20 nm to 150 nm by a plasma CVD methodor a sputtering method (FIG. 4B).
http://www.w3.org/ns/prov#wasQuotedFrom
  • patentgenius.com