PropertyValue
http://www.w3.org/1999/02/22-rdf-syntax-ns#type
http://www.w3.org/ns/prov#value
  • Such factors as the size of the wafer,the size and type of patterned features, the rate of rotation of the wafer (in an SRD embodiment), process conditions such as process environment temperature, pressure, and solution viscosity, and the like are considered in determining an optimum flowrate for a specific application.
http://www.w3.org/ns/prov#wasQuotedFrom
  • patentgenius.com