About: http://webisa.webdatacommons.org/253732236

Property	Value
http://www.w3.org/1999/02/22-rdf-syntax-ns#type	http://www.w3.org/ns/prov#Entity
http://www.w3.org/ns/prov#value	A first approach relates to increasing the parallelism of the integrated circuits to be tested, for example memory chips, a second approach is based on reducing the test period or test times.
http://www.w3.org/ns/prov#wasQuotedFrom	google.com