| http://www.w3.org/ns/prov#value | - require milling by a FIB system, which is then followed by inspection with a high-resolution SEM. The recent non-optical microscope development involves the usage of neutrally charged helium atoms projected to a sample and scattering off the surface, which allows the user to look at magnets, insulators and other materials difficult or impossible to see in an electron or ion microscope.
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