| http://www.w3.org/ns/prov#value | - Like the first embodiment, a test of the DC test, the AC tests, and the functional test which are previously prepared as the test items is performed on all the I/O pins 18, i.e., the 64 I/O pins 18 connected with the interface in each of the J semiconductor chips 22A formed in the M selected regions (Step S200).
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