| http://www.w3.org/ns/prov#value | - Field of the InventionThe present invention relates to a handling device, in particular to a device for handling the test heads of a wafer tester, including a mount for the test head disposed rotatably about its longitudinal axis on a supporting part, a frame columnon which the supporting part is vertically adjustable relative to the frame column via at least one linear bearing and a weight balanc
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