PropertyValue
http://www.w3.org/1999/02/22-rdf-syntax-ns#type
http://www.w3.org/ns/prov#value
  • Typical defects include particles, flakes, bumps, pits, voids, recesses, scratches and other irregularities or undesirable features that can exist in or on wafers.
http://www.w3.org/ns/prov#wasQuotedFrom
  • google.co.uk