| http://www.w3.org/ns/prov#value | - ion methods for generating high resolution patterns of structures on flat and contoured surfaces, including surfaces having a large radius of curvature on a wide variety of substratesUS7223635 *Jul 8, 2004May 29, 2007Hrl Laboratories, LlcOriented self-location of microstructures with alignment structuresUS7251882Sep 3, 2004Aug 7, 2007Eastman Kodak CompanyMethod for assembling micro-components to b
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