| http://www.w3.org/ns/prov#value | - In addition, when a metal (e.g., Ni in this embodiment) having a decrease in standard free energy during formation of an oxide of the metal, which decrease is large than that of a decrease in standard free energy during formation of an oxide of a metal and silicon constituting the contact electrode 119, is used, a metal film consisting of a metal such as Ti, Mg, Li, or Ca may be formed on the NiO
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