| http://www.w3.org/ns/prov#value | - In this way, the test can be conducted with a stable power without being affected by the large power noise caused by the start/stop or changing the speed of the clock.(12) In addition, the electronic circuit makes up a memory circuit, and the test pattern including the address signal and the operation control signal is input, and the read signal for the memory circuit is applied to the second latc
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