| http://www.w3.org/ns/prov#value | - In a scanning probe microscope apparatus, the improvement comprising:a. a high precision capacitance transducer having a pick-up plate movably mounted; b. means for transmitting force between an object remote from said pick-up plate and said pick-up plate; and c. means for controlling the pick-up plate including means for selectively imparting a force on the remote object via the pick-up plate. 27
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