| http://www.w3.org/ns/prov#value | - Dic 200430 Sep 2008Applied Materials, Inc.Depositing a barrier layer on the substrate, such as a titanium or tantalum containing barrier layer and depositing a ruthenium layer on the barrier layer; depositing a tungsten nucleation layer on the ruthenium layer and depositing a tungsten bulk layer on the tungsten nucleation layerUS744025521 Jul 200321 Oct 2008Micron Technology, Inc.Capacitor constru
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