PropertyValue
http://www.w3.org/1999/02/22-rdf-syntax-ns#type
http://www.w3.org/ns/prov#value
  • FIG. 20 is a graph of the measured absolute reflectance over multiple wavelengths (shown in wavenumbers cm???1) of four fluorinated silicon dioxide calibration samples with film layer thicknesses of approximately 3500 ??? (Angstroms).
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