| http://www.w3.org/ns/prov#value | - FIG. 4G is a cross-sectional view of probe head 800, the cross-section being taken along a line to provide a view similar to the one shown in FIG. 4B. In accordance with one or more embodiments of the present invention, probe tips 822 on each printed circuit board 890 are held in X and Y registration in a test plane, for example and without limitation, with respect to adjacent ones of printed circ
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