| http://www.w3.org/ns/prov#value | - iversityOptical method and system for the characterization of laterally-patterned samples in integrated circuitsUS8264693Dec 8, 2008Sep 11, 2012The Regents Of The University Of MichiganMethod and system for measuring at least one property including a magnetic property of a material using pulsed laser sourcesDE102004026145A1 *May 28, 2004May 11, 2006Advanced Micro Devices, Inc., SunnyvaleHalbleiter
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