| http://www.w3.org/ns/prov#value | - Typically, a continuous linear function is used to define the threshold over the various pattern bins as shown in FIG. 5B. Reference is now made to FIGS. 6A-6B which, taken together, are an image inspection method operative in accordance with a preferred embodiment of the present invention, and which is particularly suitable for inspecting images of dark-field illuminated objects.
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