About: http://webisa.webdatacommons.org/275057088

Property	Value
http://www.w3.org/1999/02/22-rdf-syntax-ns#type	http://www.w3.org/ns/prov#Entity
http://www.w3.org/ns/prov#value	Ellipsometry can be used to characterize composition, roughness, thickness (depth), crystalline nature, doping concentration, electrical conductivity and other material properties.
http://www.w3.org/ns/prov#wasQuotedFrom	wikipedia.org